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Chip Inductor Specifications
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Environmental
- Temperature coefficient of
inductance
- Specification
- Ceramic core:
- +25 to +125 ppm/° C typical over -40° C to +125° C at frequency
specified in product table.
- Ferrite core:
- 1008 size:
- +100 to +350 ppm/°C typical over -40° C to +85° C at frequency
specified in product table.
- 1812 size:
- +200 to +700 ppm/°C typical over -40° C to +85° C at frequency
specified in product table.
- Test method/condition
- The inductor shall be placed in an LC oscillator circuit. The
inductor will be the only portion of the circuit in the environment chamber. The change in
L will be indicated by the change in f and calculated using the equation below.
- Static humidity
- Specification
- Inductance shall not change more than ±5%.
- Q shall not change more than ±10%.
- Test method/condition
- Inductors shall be subjected to 95 ±5% R.H. at 50° C ±2° C for
100 hours. Inductors are to be tested after having air dried for two hours.
- High temperature storage
- Specification
- There shall be no case deformation or change in appearance.
- Inductance shall not change more than ±5%.
- Q shall not change more than ±10%.
- Test method/condition
- Inductors shall be subjected to +125° C for 48 ±2 hours.
- Inductors are to be tested after 1 hour at room temperature.
- Thermal shock
- Specification
- There shall be no case deformation or change in appearance.
- Inductance shall not change more than ±5%.
- Q shall not change more than ±10%.
- Test method/condition
- Inductors shall be subjected, 10 times, to the following temperature
cycle:
- -40° C for 30 minutes
- +125° C for 30 minutes
- Inductors are to be tested after 1 hour at room temperature.
- Low temperature storage
- Specification
- There shall be no case deformation or change in appearance.
- Inductance shall not change more than ±5%.
- Q shall not change more than ±10%.
- Test method/condition
- Inductor shall be subjected to -40° C ±2° C for 48 ±2 hours.
- Inductors are to be tested after 1 hour at room temperature.
Life
- High temperature load life
- Specification
- Inductors shall not have a shorted or open winding.
- Test method/condition
- Inductors shall be stored at 110° C for 1000 hours with rated
current applied. Inductor shall be tested at start of test, at 500 hours, and 1000 hours.
Inductors are to be tested after 1 hour at room temperature.
- Moisture resistance
- Specification
- Inductors shall not have a shorted or open winding.
- Test method/condition
- Inductors shall be subjected to ten 24 hour cycles at 25° C to 65°
C at 80 to 95% R.H., per MIL-STD202 Method 106. During any one of the first nine cycles,
inductors are to be removed from the chamber and exposed for 3 hours to -10° C. Inductors
are to be tested after 2 hours at room temperature.
General
- Operating temperature range
- Specification
- Ceramic core: -40° C to +125° C.
- Ferrite core: -40° C to +85° C.
- Coefficient of expansion
- Specification
- 6.7 ppm/°C (typical).
- Insulation resistance
- Specification
- 1000 megohms minimum.
- Test method/condition
- 100V DC between inductor terminals and center case.
- Dielectric withstanding voltage
- Specification
- No evidence of voltage breakdown.
- Test method/condition
- 500V AC between inductor terminals and center of case for a maximum
of 1 minute.
- Flammability
- Specification
- IEC 695-2-2.
- Test method/condition
- Withstands needle-flame test.
Other
- Solderability
- Specification
- The metalized area must have 90% min. solder coverage.
- Test method/condition
- Dip pads in flux (Alpha 100 or equiv.) and dip in solder pot
(63Sn/37Pb solder) at 232° C ±5° C for five seconds.
- Resistance to soldering heat
- Specification
- There shall be no case deformation or change in appearance.
- Inductance shall not change more than ±5%.
- Q shall not change more than ±10%.
- Test method/condition
- Inductors shall be reflowed onto a P.C. board using 63Sn/37Pb solder
paste. Solder process shall be 230° C for 20 ±2 seconds and 260° C for 5 ±2 seconds.
- Random vibration
- Specification
- There shall be no case deformation or change in appearance.
- Inductance shall not change more than ±5%.
- Q shall not change more than ±10%.
- Test method/condition
- Inductors shall be randomly vibrated per NAVMAT P9492 profile.
Samples shall be subjected to .04G/Hz for a minimum of 15 minutes per axis, for each of
three axes.
- Mechanical shock
- Specification
- There shall be no case deformation or change in appearance.
- Inductance shall not change more than ±5%.
- Q shall not change more than ±10%.
- Test method/condition
- Test per MIL-STD 202 method 213 test condition A. Test mounted
samples 3 axes, 6 times, totalling 18 shocks. (50G's, 11ms, half-sine).
- Component adhesion (push test)
- Specification
- 1 lb. - 0402 Series
2 lbs. - 0603 Series
4 lbs. - All others
- Test method/condition
- The device shall be reflow soldered (232° C ± 5° C for 10 seconds)
to a tinned copper substrate. A dynometer force gauge shall be applied to the side of the
component. The device must withstand the minimum force above without a failure of the
termination to component attachment.
- Resistance to solvent
- Specification
- There shall be no case deformation, change in appearance, or
obliteration of marking.
- Test method/condition
- Inductors shall withstand 6 minutes of alcohol.
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Updated: January 28, 1999
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