SN54LVC00A, SN74LVC00A
QUADRUPLE 2-INPUT POSITIVE-NAND GATES

SCAS279E - JANUARY 1993 - REVISED MARCH 1997

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features

• EPIC^TM (Enhanced-Performance Implanted CMOS) Submicron Process
• ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
• Latch-Up Performance Exceeds 250 mA Per JEDEC Standard JESD-17
• Typical V_OLP (Output Ground Bounce) < 0.8 V at V_CC = 3.3 V, T_A = 25°C
• Typical V_OHV (Output V_OH Undershoot) > 2 V at V_CC = 3.3 V, T_A = 25°C
• Inputs Accept Voltages to 5.5 V
• Package Options Include Plastic Small-Outline (D), Shrink Small-Outline (DB), and Thin Shrink Small-Outline (PW) Packages, Ceramic Chip Carriers (FK) and Flat (W) Packages, and DIPs (J)

EPIC is a trademark of Texas Instruments Incorporated.

description

These quadruple 2-input positive-NAND gates are designed for 2.7-V to 3.6-V V_CC operation. The 'LVC00A perform the Boolean function or Y = A\ + B\ in positive logic.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators in a mixed 3.3-V/5-V system environment.

The SN54LVC00A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVC00A is characterized for operation from -40°C to 85°C.