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JTAG UBT goes with the flow

As systems migrate to smaller, more complex designs, conventional testing methods become increasingly difficult. Texas Instruments offers a solution to this challenge with the new LVTH18512 Universal Bus Transceiver (UBT™).

The '18512 is the first UBT to provide the benefits of IEEE 1149.1 (JTAG) boundary-scan testing in a thin shrink-small outline package (TSSOP). With leads on only two sides of the package, the 64-pin TSSOP facilitates efficient board placement with flow-through pinout design, making the device suitable for applications such as telecommunications, internetworking and high-end computing.

The '18512 integrates D-type latches and D-type flip-flops for operation in transparent, latched, registered and clocked modes. JTAG testability helps eliminate the need for traditional probing, and 3.3-V operation with 5-V tolerance allows for reduced power consumption and ease of use in a mixed-voltage design.

TI offers the industry's broadest portfolio of silicon solutions for system-, board- and device-level testing. More than 40 boundary-scan devices are available in Widebus™, octal and scan-support functions in the 3.3-V LVT and 5-V ABT, ACT and BCT product families.

For complete information, order: UBT with JTAG Sample Card (SCTP001) and Data Sheet (SCBS671B). See Related Product Information

UBT and Widebus are trademarks of Texas Instruments.